TEM EDS Calibration Standards Set
TEM EDS Calibration Standards Set
 
Price: £800.00

Availability: Usually Ships in 1 to 2 Business Days
Product Code: 51-1606-065
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Description
 

TEM EDS Calibration Standards Set - AGS158

Any calibration of the EDS system used for quantitative analysis requires, at a minimum, to measure the X-ray energy of a known set of elemental standards in order to ascertain the peak positions in order to perform the required energy calibration.

For characterization of EDS systems attached or embedded to/in TEM configurations, a thin film set of standards was designed and manufactured.

Detector resolution measurement at various energies, estimation of detection limits and detector performance for light elements measurement can be performed using the TEM standards set AGS158.

Beside the standards needed for EDS system characterization, the set includes a magnification calibration standard that can be used both in TEM and STEM mode in order to match the EDS system image to be the same as the TEM and with the correct, brightness, area, linearity and magnification calibration.

Main Specifications

· Grid #1: 400 Mesh Copper grid covered with 160 – 180 nm Carbon film which enables the OI service engineer to measure Carbon position and resolution in line with the ISO 15632 EDS performance standard.

· Grid #2: 400 Mesh Copper grid covered with Holey Carbon Film as support of Aluminium Florine Trihydrate (AlF3*3H2O) 97%, CAS 15098-87-0, particles (Al 18.96%, F 40.05%, H 4.25%, O 33.73%) which enables the OI service engineer to measure Fluorine position and resolution in line with the ISO 15632 EDS performance standard.

· Grid #3: 400 Mesh Copper grid covered with Holey Carbon Film as support of Manganese (Mn) >99%, CAS 7439-96-5, particles which enables the OI service engineer to measure Manganese position and resolution in line with the ISO 15632 EDS performance standard.

· Grid #4: 400 Mesh Copper grid covered with Holey Carbon Film as support of Lead (II) Oxide (PbO), CAS 1314-36-8, particles (Pb 92.83%, O2 7.17%) to characterize the detector’s high energy performance

· Grid #5: 400 Mesh Aluminium grid covered Nickel film, purity 99.99%, thickness 10 – 12 nm used to check Oxford Instruments internal specification on light element performance as indicated by comparing the Ni l and k line intensity

· Grid #6: 400 Mesh Copper grid covered with cross grating replica. 2160 lines/mm, ruled at 90° to one another, are obtained by replication of a master grating surface using cellulose acetate film. The cellulose acetate replica is shadowed with a layer of gold-palladium alloy and finally with a carbon film which can be used for calibration the OI EDS system’s imagining parameters Spacing 462.9 nm with accuracy better of ±5%)

Click here to download specification data sheet.

We also have sample pin stubs 51-1120-465
available for SEM use.