Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale.

Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.

Oxford Instruments NanoAnalysis
Halifax Road
High Wycombe
HP12 3SE
UK

Sales
T: +44 (0) 1494 442255
F: +44 (0) 1494 524129
Email us nanoanalysis@oxinst.com

Support
T: +44 (0) 1494 442255
F: +44 (0) 1494 524129
Email us customer.support@oxinst.com